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We recorded current-time (i-t) profiles for oxidizing ferrocyanide (FCN) while spherical yeast cells of radius (rc ≈ 2 μm) collided with disk ultramicroelectrodes (UMEs) of increasing radius (re ≈ 12-45 μm). Collision signals appear as minority steps and majority blips of decreased current overlayed on the i-t baseline when cells block ferrocyanide flux (JFCN). We assigned steps to adsorption events and blips to bouncing collisions or contactless passages. Yeast cells exhibit impact signals of long duration (Δt ≈ 15-40 s) likely due to sedimentation. We assume cells travel a threshold distance (T) to generate collision signals of duration Δt. Thus, T represents a distance from the UME surface, at which cell perturbations on JFCN blend in with the UME noise level. To determine T, we simulated the UME current, while placing the cell at increasing distal points from the UME surface until matching the bare UME current. T-Values at 90°, 45°, and 0° from the UME edge and normal to the center were determined to map out T-regions in different experimental conditions. We estimated average collision velocities using the formula T/Δt, and mimicked cells entering and leaving T-regions at the same angle. Despite such oversimplification, our analysis yields average velocities compatible with rigorous transport models and matches experimental current steps and blips. We propose that single-cells encode collision dynamics into i-t signals only when cells move inside the sensitive T-region, because outside, perturbations of JFCN fall within the noise level set by JFCN and rc/re (experimentally established). If true, this notion will enable selecting conditions to maximize sensitivity in stochastic blocking electrochemistry. We also exploited the long Δt recorded here for yeast cells, which was undetectable for the fast microbeads used in early pioneering work. Because Δt depends on transport, it provides another analytical parameter besides current for characterizing slow-moving cells like yeast.. 

The varied atomic arrangements in face-centered cubic (FCC) solid solutions introduce atomic-scale fluctuations to their energy landscapes that influence the operation of dislocation-mediated deformation mechanisms. These effects are particularly pronounced in concentrated systems, which are of considerable interest to the community. Here, we examine the effect of local fluctuations in planar fault energies on the evolution of deformation twinning microstructures in randomly arranged FCC solid solutions. Our approach leverages the kinetic Monte Carlo (kMC) method to provide kinetically weighted predictions for competition between two processes: deformation twin nucleation and deformation twin thickening. The kinetic barriers underpinning each process are drawn from the statistics of planar fault energies, which are locally sampled using molecular statics methods. kMC results show an increase in the fault number densities of solid solutions relative to a homogenized reference, which is found to be driven by the fluctuations in planar fault energies. Based on kMC relations, an effective barrier model is derived to predict the competition between deformation twinning nucleation and thickening processes under a fluctuating planar fault energy landscape. A key result from this model is a measurement of the length-scale over which the influence of local fluctuations in planar fault energies diminish and nucleation/thickening-dominated behaviors converge to bulk predictions. More broadly, the tools developed in this study enable examination of the influence of chemistry and length-scale on the evolution of deformation twinning mechanisms in FCC solid solutions.